abstract
- © 2020 Elsevier Ltd. All rights reserved. Selection and Peer-review under responsibility of the scientific committee of the Tec.Nano 2019.Solid materials that do not present a perfect crystalline structure at long range are called polycrystalline materials. This deviation from a perfect crystallinity is known as the microstructure and determines the properties of materials. The microstructure can be studied by the analysis of X-ray diffraction patterns, which is known as X-ray line profile analysis (XLPA). The peaks in the diffractogram can broaden due to crystallite size, density of dislocations, planar defects, chemical heterogeneities, and surface relaxation. This allows the analysis of the microstructure via XLPA. Here, a review of the methods developed for XLPA analysis is presented. From the classical methods of Williamson-Hall and Warren-Averbach, to their modified versions and modern analysis methods are briefly described, as well as their scope and limitations. The conclusions present the area of opportunity of XLPA in polycrystalline solids today, as well as potential applications in materials science.